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1

Applying Principles From Aviation Safety Investigations to Root Cause Analysis of a Critical Incident During a Simulated Emergency

Imach, Sebastian, Eppich, Walter, Zech, Alexandra, Kohlmann, Thorsten, PrÃ¼ckner, Stephan, Trentzsch, Heiko

Journal:

Simulation in Healthcare The Journal of the Society for Simulation in Healthcare

Year:

2020

File:

PDF, 1.02 MB

2020

2

Autologous bone graft versus demineralized bone matrix in internal fixation of ununited long bones

Oliver Pieske, Alexandra Wittmann, Johannes Zaspel, Thomas Löffler, Bianka Rubenbauer, Heiko Trentzsch, Stefan Piltz

Journal:

Journal of Trauma Management & Outcomes

Year:

2009

Language:

english

File:

PDF, 311 KB

english, 2009

3

Downscaling ferroelectric field effect transistors by using ferroelectric Si-doped HfO2

Martin, Dominik, Yurchuk, Ekaterina, Müller, Stefan, Müller, Johannes, Paul, Jan, Sundquist, Jonas, Slesazeck, Stefan, Schlösser, Till, van Bentum, Ralf, Trentzsch, Martin, Schröder, Uwe, Mikolajick,

Journal:

Solid-State Electronics

Year:

2013

Language:

english

File:

PDF, 1.02 MB

english, 2013

4

[IEEE 2009 IEEE International Integrated Reliability Workshop (IRW) - South Lake Tahoe, CA, USA (2009.10.18-2009.10.22)] 2009 IEEE International Integrated Reliability Workshop Final Report - Application of fast wafer-level reliability PBTI tests for screening of High-k / Metal Gate process splits

Krause, G., Geilenkeuser, R., Trentzsch, M., Graetsch, F., Herrmann, L.

Year:

2009

Language:

english

File:

PDF, 334 KB

english, 2009

5

A quantitative study of Phosphorous implantation damage on the thick gate oxide of the 28nm node

Wan, Xinggong, Chandrashekhar, Sandhya, Bayha, Boris, Trentzsch, Martin, Balzer, Torben, Siddabathula, Mahesh, Aubel, Oliver

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 985 KB

english, 2014

6

[IEEE 2011 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2011.12.5-2011.12.7)] 2011 International Electron Devices Meeting - Impact of TDDB in MG/HK devices on circuit functionality in advanced CMOS technologies

Kerber, A., Lipp, D., Trentzsch, M., Linder, B.P., Cartier, E.

Year:

2011

Language:

english

File:

PDF, 467 KB

english, 2011

7

[IEEE 2012 4th IEEE International Memory Workshop (IMW) - Milan (2012.05.20-2012.05.23)] 2012 4th IEEE International Memory Workshop - HfO2-Based Ferroelectric Field-Effect Transistors with 260 nm Channel Length and Long Data Retention

Yurchuk, E., Muller, J., Hoffmann, R., Paul, J., Martin, D., Boschke, R., Schlosser, T., Muller, S., Slesazeck, S., van Bentum, R., Trentzsch, M., Schroder, U., Mikolajick, T.

Year:

2012

Language:

english

File:

PDF, 251 KB

english, 2012

8

Investigation of Ultra Thin Thermal Nitrided Gate Dielectrics in Comparison to Plasma Nitrided Gate Dielectrics for High-Performance Logic Application for 65nm

Trentzsch, Martin, Golz, Christian, Wieczorek, Karsten, Stephan, Rolf, Mantei, Tilo, Bayha, Boris, Ohsiek, Susanne, Raab, Michael, Nényei, Zsolt, Lerch, Wilfried, Niess, Jürgen, Dietl, Waltraud, Kirch

Journal:

Materials Science Forum

Year:

2008

Language:

english

File:

PDF, 540 KB

english, 2008

9

[IEEE 2016 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2016.12.3-2016.12.7)] 2016 IEEE International Electron Devices Meeting (IEDM) - A 28nm HKMG super low power embedded NVM technology based on ferroelectric FETs

Trentzsch, M., Flachowsky, S., Richter, R., Paul, J., Reimer, B., Utess, D., Jansen, S., Mulaosmanovic, H., Muller, S., Slesazeck, S., Ocker, J., Noack, M., Muller, J., Polakowski, P., Schreiter, J.,

Year:

2016

Language:

english

File:

PDF, 694 KB

english, 2016

10

[IEEE 2017 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2017.12.2-2017.12.6)] 2017 IEEE International Electron Devices Meeting (IEDM) - A FeFET based super-low-power ultra-fast embedded NVM technology for 22nm FDSOI and beyond

Dunkel, S., Trentzsch, M., Richter, R., Moll, P., Fuchs, C., Gehring, O., Majer, M., Wittek, S., Muller, B., Melde, T., Mulaosmanovic, H., Slesazeck, S., Muller, S., Ocker, J., Noack, M., Lohr, D.-A.,

Year:

2017

Language:

english

File:

PDF, 1.37 MB

english, 2017

11

Nonparametric change point estimation for survival distributions with a partially constant hazard rate

Brazzale, Alessandra R., Küchenhoff, Helmut, Krügel, Stefanie, Schiergens, Tobias S., Trentzsch, Heiko, Hartl, Wolfgang

Journal:

Lifetime Data Analysis

Year:

2018

Language:

english

File:

PDF, 591 KB

english, 2018

12

Degradation studies of modified inulin as potential encapsulation material for colon targeting and release of mesalamine

Walz, Michael, Hagemann, Diana, Trentzsch, Marcus, Weber, Achim, Henle, Thomas

Journal:

Carbohydrate Polymers

Year:

2018

Language:

english

File:

PDF, 863 KB

english, 2018

13

„Alle reden von Qualität …“; “Everyone talks about quality …”;

Trentzsch, H., Matthes, G., Mutschler, W.

Journal:

Der Unfallchirurg

Year:

2018

Language:

german

File:

PDF, 142 KB

german, 2018

14

Remote-Sensoring – neue Optionen des Progressionsmonitorings bei Multipler Sklerose; Enhancing monitoring of disease progression—remote sensoring in multiple sclerosis;

Weidemann, M. L., Trentzsch, K., Torp, C., Ziemssen, T.

Journal:

Year:

2019

Language:

german

File:

PDF, 477 KB

german, 2019

15

Ferroelectric ternary content-addressable memory for one-shot learning

Ni, Kai, Yin, Xunzhao, Laguna, Ann Franchesca, Joshi, Siddharth, Dünkel, Stefan, Trentzsch, Martin, Müeller, Johannes, Beyer, Sven, Niemier, Michael, Hu, Xiaobo Sharon, Datta, Suman

Journal:

Nature Electronics

Year:

2019

Language:

english

File:

PDF, 2.67 MB

english, 2019

16

[IEEE ESSDERC 2019 - 49th European Solid-State Device Research Conference (ESSDERC) - Cracow, Poland (2019.9.23-2019.9.26)] ESSDERC 2019 - 49th European Solid-State Device Research Conference (ESSDERC) - Ultra-dense co-integration of FeFETs and CMOS logic enabling very-fine grained Logic-in-Memory

Breyer, Evelyn T., Mulaosmanovic, Halid, Trommer, Jens, Melde, Thomas, Dunkel, Stefan, Trentzsch, Martin, Beyer, Sven, Mikolajick, Thomas, Slesazeck, Stefan

Year:

2019

Language:

english

File:

PDF, 2.35 MB

english, 2019

17

Schwerverletztenversorgung (Diagnostik und Therapie der ersten 24 Stunden) || 28 Verletzungen an Knie und Unterschenkel

Flohé, Sascha, Matthes, Gerrit, Paffrath, Thomas, Trentzsch, Heiko, Wölfl, Christoph

Year:

2018

File:

PDF, 1.46 MB

2018

18

[IEEE 2020 IEEE International Memory Workshop (IMW) - Dresden, Germany (2020.5.17-2020.5.20)] 2020 IEEE International Memory Workshop (IMW) - FeFET: A versatile CMOS compatible device with game-changing potential

Beyer, Sven, Dunkel, Stefan, Trentzsch, Martin, Muller, Johannes, Hellmich, Andreas, Utess, Dirk, Paul, Jan, Kleimaier, Dominik, Pellerin, John, Muller, Stefan, Ocker, Johannes, Benoist, Antoine, Zhou

Year:

2020

File:

PDF, 1.41 MB

2020

19

[IEEE 2020 IEEE International Memory Workshop (IMW) - Dresden, Germany (2020.5.17-2020.5.20)] 2020 IEEE International Memory Workshop (IMW) - Performance and Reliability of 4 Mb eFLASH Memory Array Featuring 28 nm Split-Gate Cell with HKMG Select Transistor

Jourba, S., Bollon, N., Decobert, C., Festes, G., Bertello, B., Zhou, F., Markov, V., Tkachev, Y., Kim, J., Ghazav, P., Liu, X., Do, N., Richter, R., Dunkel, S., Trentzsch, M., Zaka, A., Herrmann, T.,

Year:

2020

File:

PDF, 796 KB

2020

20

Impact of nitrogen post deposition annealing on hafnium zirconate dielectrics for 32 nm high-performance SOI CMOS technologies

T. Kelwing, A. Naumann, M. Trentzsch, F. Graetsch, B. Bayha, L. Herrmann, B. Trui, D. Rudolph, D. Lipp, G. Krause, R. Carter, R. Stephan, P. Kücher, W. Hansch

Journal:

Microelectronic Engineering

Year:

2011

Language:

english

File:

PDF, 676 KB

english, 2011

21

7th Worldcongress on Trauma, Shock, Inflammation and Sepsis

Journal:

Der Unfallchirurg

Year:

2007

Language:

german

File:

PDF, 644 KB

german, 2007

22

Randomisierte klinische Studien in der Unfallchirurgie

H. Trentzsch, S. Piltz, G. Täger, F. Berger, E. Steinhausen, E.A.M. Neugebauer, D. Rixen, Die Mitglieder der Damage Control Study

Journal:

Der Unfallchirurg

Year:

2009

Language:

german

File:

PDF, 595 KB

german, 2009

23

Clinical benefit of hydroxyapatite-coated pins compared with stainless steel pins in external fixation at the wrist: A randomised prospective study

Oliver Pieske, Felicitas Kaltenhauser, Leopold Pichlmaier, Nicolai Schramm, Heiko Trentzsch, Thomas Löffler, Axel Greiner, Stefan Piltz

Journal:

Year:

2010

Language:

english

File:

PDF, 145 KB

english, 2010

24

Tunneling Effective Mass of Electrons in Lightly N-Doped Gate Insulators

Nadimi, E., Golz, C., Trentzsch, M., Herrmann, L., Wieczorek, K., Radehaus, C.

Journal:

IEEE Transactions on Electron Devices

Year:

2008

Language:

english

File:

PDF, 853 KB

english, 2008

25

IL-10 Plasma Levels are Elevated After LPS Injection in Splenectomized A/J Mice1

Manuel B. Torres, Virginia L. Vega, Mazen Bedri, Daniel Saad, Heiko Trentzsch, Roger H. Reeves, Antonio De Maio

Journal:

Journal of Surgical Research

Year:

2005

Language:

english

File:

PDF, 214 KB

english, 2005

26

The combination of polymicrobial sepsis and endotoxin results in an inflammatory process that could not be predicted from the independent insults

Heiko Trentzsch, Dylan Stewart, Charles N. Paidas, Antonio De Maio

Journal:

Journal of Surgical Research

Year:

2003

Language:

english

File:

PDF, 207 KB

english, 2003

27

Evidenzbasierte Triage von verletzten Patienten am Unfallort

Dr. H. Trentzsch, B. Urban, S. Huber-Wagner

Journal:

Notfall + Rettungsmedizin

Year:

2012

Language:

german

File:

PDF, 331 KB

german, 2012

28

H.-J. Oestern (Herausgeber): Das Polytrauma-Präklinisches und klinisches Management, Urban & Fischer Verlag bei Elsevier München, 1. Auflage 2007. 416 Seiten, 200 s/w und 100 farbige Abbildungen, sowie 50 Tabellen Preis: 99,95 € ISBN: 978-3-437-24280-9

Heiko Trentzsch

Journal:

Perioperative Medizin

Year:

2010

Language:

german

File:

PDF, 146 KB

german, 2010

29

[IEEE 2012 IEEE Symposium on VLSI Technology - Honolulu, HI, USA (2012.06.12-2012.06.14)] 2012 Symposium on VLSI Technology (VLSIT) - Ferroelectricity in HfO2 enables nonvolatile data storage in 28 nm HKMG

Muller, J., Yurchuk, E., Schlosser, T., Paul, J., Hoffmann, R., Muller, S., Martin, D., Slesazeck, S., Polakowski, P., Sundqvist, J., Czernohorsky, M., Seidel, K., Kucher, P., Boschke, R., Trentzsch,

Year:

2012

Language:

english

File:

PDF, 760 KB

english, 2012

30

Neuigkeiten aus der Polytraumaversorgung: aktuelle Fakten und Entwicklungen

Trentzsch, H., WÃ¶lfl, C., Matthes, G., Paffrath, T., Lefering, R., FlohÃ©, S.

Journal:

Der Unfallchirurg

Year:

2013

Language:

german

File:

PDF, 211 KB

german, 2013

31

Neues aus der Schwerverletztenversorgung

Dr. H. Trentzsch, C. Wölfl, G. Matthes, T. Paffrath, U. Nienaber…

Journal:

Der Unfallchirurg

Year:

2013

Language:

german

File:

PDF, 250 KB

german, 2013

32

[IEEE 2012 12th Annual Non-Volatile Memory Technology Symposium (NVMTS) - Singapore, Singapore (2012.10.31-2012.11.2)] 2012 12th Annual Non-Volatile Memory Technology Symposium Proceedings - Non-volatile data storage in HfO2-based ferroelectric FETs

Schroeder, U., Yurchuk, E., Mueller, S., Mueller, J., Slesazeck, S., Schloesser, T., Trentzsch, M., Mikolajick, T.

Year:

2013

Language:

english

File:

PDF, 629 KB

english, 2013

33

The Degradation Process of High- $k~{\rm SiO}_{2}/{\rm HfO}_{2}$ Gate-Stacks: A Combined Experimental and First Principles Investigation

Nadimi, Ebrahim, Roll, Guntrade, Kupke, Steve, Ottking, Rolf, Planitz, Philipp, Radehaus, Christian, Schreiber, Michael, Agaiby, Rimoon, Trentzsch, Martin, Knebel, Steve, Slesazeck, Stefan, Mikolajick

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.26 MB

english, 2014

34

Influence of Frequency Dependent Time to Breakdown on High-K/Metal Gate Reliability

Knebel, Steve, Kupke, Steve, Schroeder, Uwe, Slesazeck, Stefan, Mikolajick, Thomas, Agaiby, Rimoon, Trentzsch, Martin

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 516 KB

english, 2013

35

Rocuronium und Sugammadex in der Notfallmedizin

Luxen, J., Trentzsch, H., Urban, B.

Journal:

Der Anaesthesist

Year:

2014

Language:

german

File:

PDF, 387 KB

german, 2014

36

Verbessern simulatorbasierte Teamtrainings die Patientensicherheit?

Trentzsch, H., Urban, B., Sandmeyer, B., Hammer, T., Strohm, P.C., Lazarovici, M.

Journal:

Der Unfallchirurg

Year:

2013

Language:

german

File:

PDF, 620 KB

german, 2013

37

Panorama

Luxen, J., Trentzsch, H., Urban, B.

Journal:

Wiener Klinisches Magazin

Year:

2014

Language:

german

File:

PDF, 239 KB

german, 2014

38

Das "Geschäft" mit der Angst

Luxen, J., Trentzsch, H., Urban, B.

Journal:

Wiener Klinisches Magazin

Year:

2014

Language:

german

File:

PDF, 165 KB

german, 2014

39

Rocuronium und Sugammadex in der Notfallmedizin

Luxen, J., Trentzsch, H., Urban, B.

Journal:

Wiener Klinisches Magazin

Year:

2014

Language:

german

File:

PDF, 405 KB

german, 2014

40

[IEEE 2012 13th International Conference on Ultimate Integration on Silicon (ULIS) - Grenoble, France (2012.03.6-2012.03.7)] 2012 13th International Conference on Ultimate Integration on Silicon (ULIS) - Downscaling ferroelectric field effect transistors by using ferroelectric Si-doped HfO2

Martin, Dominik, Yurchuk, Ekaterina, Muller, Stefan, Muller, Johannes, Paul, Jan, Sundquist, Jonas, Slesazeck, Stefan, Schloesser, Till, van Bentum, Ralf, Trentzsch, Martin, Schroeder, Uwe, Mikojajick

Year:

2012

Language:

english

File:

PDF, 177 KB

english, 2012

41

Female sex protects from organ failure and sepsis after major trauma haemorrhage

Trentzsch, H., Nienaber, U., Behnke, M., Lefering, R., Piltz, S.

Journal:

Year:

2014

Language:

english

File:

PDF, 956 KB

english, 2014

42

[IEEE 2008 IEEE International Integrated Reliability Workshop Final Report (IRW) - South lake Tahoe, CA, USA (2008.10.12-2008.10.16)] 2008 IEEE International Integrated Reliability Workshop Final Report - Reliability Guard Band Reduction by Differential Targeting of pMOS Gate Oxide Thickness

Geilenkeuser, R., Wieczorek, K., Trentzsch, M., Graetsch, F., Bayha, B., Samohvalov, V., Paetzold, T., Schink, T.

Year:

2008

Language:

english

File:

PDF, 987 KB

english, 2008

43

Quality of life two years after severe trauma: A single centre evaluation

Kaske, Sigune, Lefering, Rolf, Trentzsch, Heiko, Driessen, Arne, Bouillon, Bertil, Maegele, Marc, Probst, Christian

Journal:

Year:

2014

Language:

english

File:

PDF, 462 KB

english, 2014

44

Comparison of MOCVD- and ALD-Deposited $ \hbox{HfZrO}_{4}$ Gate Dielectrics for 32-nm High-Performance Logic SOI CMOS Technologies

Kelwing, Torben, Naumann, Andreas, Trentzsch, Martin, Trui, Bernhard, Herrmann, Lutz, Mutas, Sergej, Graetsch, Falk, Carter, Rick, Stephan, Rolf, Kucher, Peter, Hansch, Walter

Journal:

IEEE Electron Device Letters

Year:

2010

Language:

english

File:

PDF, 211 KB

english, 2010

45

Interaction of oxygen vacancies and lanthanum in Hf-based high- k dielectrics: an ab initio investigation

Nadimi, Ebrahim, Öttking, Rolf, Plänitz, Philipp, Trentzsch, Martin, Kelwing, Torben, Carter, Rick, Schreiber, Michael, Radehaus, Christian

Journal:

Journal of Physics Condensed Matter

Year:

2011

Language:

english

File:

PDF, 690 KB

english, 2011

46

Marginal Fit of Heat-pressed vs CAD/CAM Processed All-ceramic Onlays Using a Milling Unit Prototype

Reich, S., Gozdowski, S., Trentzsch, L., Frankenberger, R., Lohbauer, U.

Journal:

Operative Dentistry

Year:

2008

Language:

english

File:

PDF, 1.91 MB

english, 2008

47

[IEEE 2008 IEEE International Integrated Reliability Workshop Final Report (IRW) - South lake Tahoe, CA, USA (2008.10.12-2008.10.16)] 2008 IEEE International Integrated Reliability Workshop Final Report - Reliability Guard Band Reduction by Differential Targeting of pMOS Gate Oxide Thickness

Geilenkeuser, R., Wieczorek, K., Trentzsch, M., Graetsch, F., Bayha, B., Samohvalov, V., Paetzold, T., Schink, T.

Year:

2008

Language:

english

File:

PDF, 2.32 MB

english, 2008

48

[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - Dynamic off-state TDDB of ultra short channel HKMG nFETS and its implications on CMOS logic reliability

Kupke, S., Knebel, S., Rahman, S., Slesazeck, S., Mikolajick, T., Mikolajick, T., Agaiby, R., Trentzsch, M.

Year:

2014

Language:

english

File:

PDF, 393 KB

english, 2014

49

Etomidat zur „rapid sequence induction“ bei schwerem Trauma

Trentzsch, H., Münzberg, M., Luxen, J., Urban, B., Prückner, S.

Journal:

Notfall + Rettungsmedizin

Year:

2014

Language:

german

File:

PDF, 841 KB

german, 2014

50

Nadeldekompression des Spannungspneumothorax

Hockertz, D.K., Braun, K.F., Trentzsch, H.

Journal:

Notfall + Rettungsmedizin

Year:

2015

Language:

german

File:

PDF, 228 KB

german, 2015